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Researchers from the NIST Center for Nanoscale Science and Technology (CNST) and the Republic of Korea's national metrology institute—the Korea Research Institute of Standards and Science (KRISS)—have recently developed a unique nanoscale measurement technique and used it to observe structural disorder in graphene that is fabricated on a silicon carbide substrate ("Thermoelectric imaging of structural disorder in epitaxial graphene").

BTW, the Koreans have filed more patents on nanotechnology than anyone else on the planet. To read more, click here.
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