Scientists can now look deeper into new materials to study their structure and behavior, thanks to work by an international group of researchers led by UC Davis and the Lawrence Berkeley National Laboratory and published Aug. 14 by the journal Nature Materials.
The technique will enable more detailed study of new types of materials for use in electronics, energy production, chemistry and other applications.
The technique, called angle-resolved photoemission, has been used since the 1970s to study materials, especially properties such as semiconductivity, superconductivity and magnetism. But the technique allows probing to a depth of only about a nanometer beneath the surface of a material, a limit imposed by the strong inelastic scattering of the emitted electrons.
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