Some of the most promising and puzzling phenomena in physics play out on the nanoscale, where a billionth-of-a-meter shift can make or break perfect electrical conductivity.
Now, scientists have developed a new method to probe three-dimensional, atomic-scale intricacies and chemical compositions with unprecedented precision. The breakthrough technique -- described February 6 in the journal Nano Letters -- combines atomic-force microscopy with near-field spectroscopy to expose the surprising damage wreaked by even the most subtle forces.
"This is like granting sight to the blind," said lead author Adrian Gozar of Yale University. "We can finally see the all-important variations that dictate functionality at this scale and better explore both cutting-edge electronics and fundamental questions that have persisted for decades."
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