Chongqing University, leading as the primary author, recently published groundbreaking research titled "3D Microscopy at the Nanoscale Reveals Unexpected Lattice Rotations in Deformed Nickel" in the prestigious journal Science. This study marks a significant advance in nanotechnology.
Led by Professor Huang Xiaoxu from Chongqing University's College of Materials Science and Engineering, the team's development of a one-nanometer resolution 3D transmission electron microscopy technique represents a major global breakthrough in nano-scale 3D imaging technology.
"Most of the materials in our natural world and synthetic materials are crystalline, composed of many small grains," Professor Huang explained.
Huang clarified that each grain comprises neatly arranged atoms, and parameters such as the size, shape, internal atomic arrangement orientation, spatial distribution of these grains, and their interfacial parameters (i.e., grain boundaries) play a decisive role in the material's performance.
"Generally, the smaller the grain size, the better the performance," Huang said.
"However, traditional electron microscopy can only observe the surface of micro and nano-device samples or view two-dimensional projections of the material's internal three-dimensional structure.," said Huang. "This severely limits our understanding of the material's microstructure and is insufficient for our research needs."
He added, "To deepen our understanding of material mechanisms and improve their performance, a true and complete three-dimensional characterization of material structural parameters is essential."
Over the past decade, Huang's team has technologically transformed traditional transmission electron microscopy. They developed an integrated control system for electron beam scanning, image acquisition, and sample stage, along with new algorithms and a series of analytical software.
They have pioneered new 3D characterization techniques and devices in transmission electron microscopy, exemplified by crystal orientation 3D reconstruction technology. This innovation achieves three-dimensional characterization of the grain boundary, interface, and crystallographic characteristics of grains with a spatial resolution of one nanometer and crystal orientation resolution of one degree.
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