Scientists have developed a groundbreaking quantum interferometry tool that achieves nanometer-scale precision in challenging environments.
Researchers at the University of Illinois, led by Physics Professor Paul Kwiat, have unveiled a groundbreaking tool that is reshaping precision measurement at the nanometer scale. Designed to perform even in challenging environments filled with background noise and optical loss, this new optical interferometry technology taps into the quantum properties of light. By using a phenomenon called extreme color entanglement, it achieves faster and more accurate measurements than traditional methods, both classical and quantum.
Colin Lualdi, Illinois Physics graduate student and lead author of the study, emphasizes, “By taking advantage of both quantum interference and quantum entanglement, we can make measurements that would otherwise be difficult with existing methods.”
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